Repair I/O fuse circuit of semiconductor memory device

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S225700

Reexamination Certificate

active

11306072

ABSTRACT:
A repair I/O fuse circuit of a semiconductor memory device includes a reduced by as much as half layout area of fuses by replacing what one repair I/O information is represented by existing two I/O fuses with what one repair I/O information is represented by one I/O fuse. The repair I/O fuse circuit includes a plurality of I/O fuse circuits, each having one fuse. A repair signal indicates that there is an address to be replaced. If a chip enable signal is activated, each of the plurality of I/O fuse circuits outputs a repair I/O information signal depending on whether a fuse has been cut.

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