Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-05-27
2008-05-27
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700
Reexamination Certificate
active
11616702
ABSTRACT:
A repair fuse circuit includes an address comparator, and a plurality of I/O bus select bit output units. The address comparator outputs repair signals for selecting a redundant column that will replace a full column of a plurality of redundant columns according to a column address. The plurality of I/O bus select bit output units for outputting signals corresponding to respective bits of I/O bus repair signals for selecting an I/O bus to which the redundant column will be connected according to the repair signals.
REFERENCES:
patent: 6307794 (2001-10-01), Haga
patent: 6552937 (2003-04-01), Ladner et al.
patent: 2006/0239074 (2006-10-01), Abedifard
patent: 100170701 (1998-10-01), None
Nguyen Tan T.
Townsend and Townsend / and Crew LLP
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