Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2005-09-27
2005-09-27
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700, C365S230060
Reexamination Certificate
active
06950351
ABSTRACT:
A repair circuit includes a bit fail repair block for using the column and row addresses to determine whether they are fail addresses in order to decide whether bit repair for the fail addresses are to be performed, a row repair block for determining whether the row addresses are fail and deciding whether row repair for the row addresses are to be performed depending on the output of the bit fail repair block, and a plurality of column repair blocks for deciding whether column repair for the column addresses are to be performed and deciding whether a normal column driver must be selected, depending on the column address, column fuse boxes and an output signal of the bit fail repair block.
REFERENCES:
patent: 6084807 (2000-07-01), Choi
Hynix / Semiconductor Inc.
Lam David
Mayer Brown Rowe & Maw LLP
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