Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate
2011-03-15
2011-03-15
Cho, James H. (Department: 2819)
Electronic digital logic circuitry
Reliability
Redundant
C326S009000, C326S038000, C326S041000, C714S100000, C714S710000
Reexamination Certificate
active
07906984
ABSTRACT:
A Field Programmable Gate Array (FPGA) circuit capable of operating through at least one fault. The FPGA circuit includes a configuration memory and an embedded microprocessor. The embedded microprocessor having access to the configuration memory, static modules, at least one relocatable module, and at least one spare module. The relocatable module being relocatable from a first target area to a second target area. The relocatable module being relocatable by manipulating a partial bitstream with the embedded microprocessor. The microprocessor calculating a plurality of bitstream changes, to relocate the at least one relocatable module using at least triple modular redundancy (TMR).
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Baldwin Rusty O.
Montminy David P.
Williams Paul D.
AFMCLO/JAZ
Cho James H.
Lo Christopher
Sinder Fredric L.
The United States of America as represented by the Secretary of
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