Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-31
2006-10-31
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S019000
Reexamination Certificate
active
07131088
ABSTRACT:
In accordance with the present invention there is provided a method for determining an optimized parameter for a circuit simulation. A circuit path for the simulation is determined, and maximum and minimum optimization parameters are decided. Next, the circuit path is simulated using the maximum optimization parameter. The circuit path is simulated using the minimum optimization parameter and a primary criteria parameter is also calculated. The simulations are compared to determine whether the same status (both succeed or both fail) is generated for both the minimum optimization parameter and the maximum optimization parameter. If the simulations do not indicate the same status, then the optimization parameter is recalculated and the circuit is simulated until the primary criteria parameter converges to a prescribed value.
REFERENCES:
patent: 6112022 (2000-08-01), Wei
patent: 6249901 (2001-06-01), Yuan et al.
patent: 6289412 (2001-09-01), Yuan et al.
patent: 6732066 (2004-05-01), Krishnamoorthy
patent: 6745376 (2004-06-01), Fredrickson
patent: 6854102 (2005-02-01), Maheshwari
patent: 6934922 (2005-08-01), Burnley
patent: 6990646 (2006-01-01), Yoshikawa
patent: 2003/0093763 (2003-05-01), McConaghy
Liao Yuhung
Liu Mingchi
Ping Yu-Jiao
Wei You-Pang
Buchanan Ingersoll & Rooney LLP
Dimyan Magid Y.
Legend Design Technology, Inc.
Whitmore Stacy A.
LandOfFree
Reliability based characterization using bisection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Reliability based characterization using bisection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reliability based characterization using bisection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3709818