Relaxed SiGe films by surfactant mediation

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

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C117S090000

Reexamination Certificate

active

06995076

ABSTRACT:
A metallic surfactant, e.g., Sb, Bi, As, or atomic hydrogen is used to grow a high quality, relaxed, relatively thin SiGe buffer having a very smooth surface and a very low threading dislocation density, on which high-quality films are epitaxially grown for various applications.

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Jernigan G G et al: “Composition and morphology of SiGe alloys grown on Si(100) using an Sb surfactant” Journal of Crystal Growth, North-Holland Publishing Co. Amsterdam, NL, vol. 213, No. 3-4, Jun. 2000.
Sakamoto K. et al: “Which surfactant shall we choose for the heteroepitaxy of GE/SI(001)? OBI as a surfactant with small self-incorporation” Japanese Journal of Applied Physics, Publication Office Japanese Journal of Applied Physics, Tokyo, JP, vol. 32, No. 2A, part 2, Feb. 1, 1993.
Zaima S et al: “Surfactant effect of H atoms on the suppression of GE segregation in SI overgrown on FE (N ML)/SI(100) substrates by gas source molecular beam epitaxy” Journal of Crystal Growth, North-Holland Publishing Co. Amsterdam, NL, vol. 150, No. 1/4, part 2 May 1, 1995.
J.L. Liu et al., “High-quality Ge films on Si substrates using Sb surfactant-mediated graded SiGe buffers,”Applied Physics Letters79(21):3431-3433 (2001).
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J.L. Liu et al., “Growth study of surfactant-mediated relaxed SiGe graded layers for 1.55-μm photodetector applications,”Thin Solid Films380 (2000):54-56 (2000).
J.L. Liu et al., “A surfactant-mediated relaxed Si0.5Ge0.5graded layer with a very low threading dislocation density and smooth surface,”Applied Physics Letters75(11):1586-1588 (1999).

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