Regression calibrated spectroscopic rotating compensator ellipso

Details Regression calibrated spectroscopic rotating compensator ellipso Regression calibrated spectroscopic rotating compensator ellipso

1997-08-15

1999-02-16

Pham, Hoa Q.

Optics: measuring and testing

By polarized light examination

Of surface reflection

364525, 250225, G01N 2121

Patent

active

058726306

ABSTRACT:
A Spectroscopic Rotating Compensator Material System Investigation System including a Photo Array for simultaneously detecting a Multiplicity of Wavelengths is disclosed. The Spectroscopic Rotating Compensator Material System Investigation System is calibrated by a Mathematical Regression based technique involving, where desirable, Parameterization of Calibration Parameters. Calibration is possible utilizing a single two dimensional Data Set obtained with the Spectroscopic Rotating Compensator Material System Investigation System in a "Material System present" or in a Straight-through" configuration.

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