Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2006-08-29
2006-08-29
Tran, Michael (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S233100
Reexamination Certificate
active
07099222
ABSTRACT:
In a semiconductor memory device incorporating a memory core circuit requiring a refresh operation, a clock signal modifying circuit receives an external clock signal to generate a modified clock signal which is ineffective from a timing when the control is switched from an active mode to a special mode to a timing when at least one clock pulse time period of the external clock signal has passed after the control is switched from said special mode to an active mode. A forced refresh request signal generating circuit generates a forced refresh request signal at predetermined time periods and an internal clock signal having the same period as said forced refresh request signal. An all-time refresh request signal generating circuit generates an all-time refresh request signal in synchronization with the modified clock signal and the internal clock signal. A multiplexer selects the forced refresh request signal in the special mode and selects the all-time refresh request signal in the actual mode. A refresh pulse generating circuit generates a refresh pulse signal in accordance with one of the forced refresh request signal and the all-time refresh request signal selected by the multiplexer and transmits the refresh pulse signal to the memory core circuit. A read/write pulse generating circuit generates a read/write pulse signal in synchronization with the modified clock signal and transmits the read/write pulse signal to the memory core circuit.
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Katoh Yoshiyuki
Takahashi Hiroyuki
NEC Electronics Corporation
Tran Michael
Young & Thompson
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