Reflective photomask and method of fabricating the same

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S311000, C430S394000

Reexamination Certificate

active

07807318

ABSTRACT:
A reflective photomask for EUV light is disclosed. The reflective photomask may include a projecting pattern selectively formed on a substrate and a reflective layer on the substrate and the projecting pattern.

REFERENCES:
patent: 6048652 (2000-04-01), Nguyen et al.
patent: 2004/0136075 (2004-07-01), Augustyn et al.
patent: 2005/0084768 (2005-04-01), Han et al.
patent: 2005/0151095 (2005-07-01), Sugawara
patent: 2005/0208389 (2005-09-01), Ishibashi et al.
patent: 2005/0276988 (2005-12-01), Trenkler
patent: 2006/0281017 (2006-12-01), Kim et al.
patent: 2004-289110 (2004-10-01), None
patent: 1019930008139 (1993-08-01), None
patent: 10-0335735 (2002-04-01), None
patent: 1020030082819 (2003-10-01), None
patent: 100604938 (2006-07-01), None
Korean Notice of Allowance dated May 30, 2007.
Korean Notice of Examination Report dated Nov. 18, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Reflective photomask and method of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reflective photomask and method of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reflective photomask and method of fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4162309

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.