Reflected light measuring method and reflected light measuring a

Details Reflected light measuring method and reflected light measuring a Reflected light measuring method and reflected light measuring a

1994-06-20

1995-06-06

Rosenberger, Richard A.

Optics: measuring and testing

Of light reflection

356382, G01B 1100

Patent

active

054227038

ABSTRACT:
A method of measuring light reflected by a test sample with a microscopic photometric system. The test sample placed in an in-focus position of an objective is irradiated, and light reflected by the test sample is measured. Stray light generated by microscopic optics including the objective is measured with the test sample placed in an out-of-focus position of the objective. Light actually reflected by the test sample is determined from a difference between the reflected light and the stray light measured.

REFERENCES:
patent: 4566798 (1986-01-01), Hass
patent: 5108176 (1992-04-01), Malin et al.
patent: 5233405 (1993-08-01), Wildnauer et al.

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