4. Optics: measuring and testing
  5. Of light reflection

Masahiko Kokubo

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Illumination apparatus

Illumination – Light source and modifier – Including reflector
Patent

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Method of and apparatus for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of measuring film thicknesses

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical scanner

Optical: systems and elements – Lens – High distortion lens
Reexamination Certificate

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Optical scanner

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1155767

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