Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1999-10-19
2000-10-03
Evans, F. L.
Optics: measuring and testing
By polarized light examination
Of surface reflection
G01J 400, G01N 2121
Patent
active
061280852
ABSTRACT:
An apparatus uses reflectance spectrophotometry to characterize a sample having any number of thin films. The apparatus uses two toroidal mirrors in an optical relay to direct light reflected by the sample to a spectroscopic device. A computer then analyzes the reflected spectrum to characterize the optical properties of the sample. The optical relay allows a range of angles of reflection from the sample, and has no chromatic aberration. The optical relay is also arranged so that the non-chromatic aberration is minimized. For polarization-based measurements polarizing elements can be used in the apparatus and the spectroscopic device can be a spectroscopic ellipsometer. The sample is mounted on a movable stage so that different areas of the sample may be characterized. Furthermore, a deflector and a viewer are used to allow the operator of the apparatus to view the region of the sample under study.
REFERENCES:
patent: 5184191 (1993-02-01), Krishnan
Buermann Dale
Forouhi Abdul Rahim
Mandella Michael J.
Evans F. L.
N & K Technology, Inc.
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