Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate
2007-02-28
2009-10-06
Barnie, Rexford N (Department: 2819)
Electronic digital logic circuitry
Reliability
Redundant
Reexamination Certificate
active
07598765
ABSTRACT:
Systems and methods are disclosed directed to techniques with respect to defective configuration memory cells. For example, in accordance with an embodiment of the present invention, a programmable logic device includes a plurality of configuration memory cells; and at least one spare memory cell, wherein the at least one spare memory cell is adapted to store configuration data to provide to at least one defective configuration memory cell.
REFERENCES:
patent: 5831907 (1998-11-01), Trimberger
patent: 6201404 (2001-03-01), Reddy
patent: 6344755 (2002-02-01), Reddy
patent: 7180324 (2007-02-01), Chan
patent: 7254069 (2007-08-01), Haraguchi et al.
Cheng Chan-Chi Jason
Singh Satwant
Barnie Rexford N
Haynes and Boone LLP
Lattice Semiconductor Corporation
Tran Thienvu V
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