Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate
2007-02-20
2007-02-20
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Reliability
Redundant
C326S009000, C326S041000
Reexamination Certificate
active
10856434
ABSTRACT:
An embodiment of the present invention provides a programmable logic device (“PLD”) including a redundancy architecture adapted to selective route signals via first or second staggered vertical lines. Other embodiments provide configuration logic and programs for determining routing selections. Other embodiments provide proximate grouping of vertical lines driven from a same row. Other embodiments provide definition of spare row locations once defective row locations are known.
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Chan Michael
Lane Chris
Leventis Paul
Lewis David
Yi Hyun Mo
Altera Corporation
Beyer & Weaver, LLP
Tran Anh Q.
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