Redundancy element check in IC memory without programming substi

Details Redundancy element check in IC memory without programming substi Redundancy element check in IC memory without programming substi

1993-07-30

1995-04-04

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Bad bit

365201, 36523003, 371 102, G11C 700

Patent

active

054043310

ABSTRACT:
Disclosed is an integrated circuit memory having a plurality of addressable elements and a plurality of redundant elements for substitution of the addressable elements. A configurable selection circuit for each redundant element allows for associating the redundant element with an address for access of the redundant element in place of an addressable element, upon permanent physical modification of the integrated circuit memory. Redundant element testing is provided by use of bypass circuitry, responsive to a redundant element test signal. The bypass circuitry includes circuitry associated with each redundant element, for simulating access of the redundant element without modification of the configurable selection circuit for the redundant element. Each redundant element has an address, unique among the redundant elements but duplicating an address for a regular element, which is used for accessing the redundant element during testing.

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