Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-05-29
2007-05-29
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
Reexamination Certificate
active
11108179
ABSTRACT:
A semiconductor random access memory device has an array of normal memory and an array of dummy memory cells. The array of the dummy memory cells are controlled in order to form a redundant twin-cell structure that includes at least one of the dummy memory cells.
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Dicke Billig & Czaja, PLLC
Dinh Son
Infineon - Technologies AG
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