Redundancy circuit of semiconductor memory device

Static information storage and retrieval – Read/write circuit – Bad bit

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36518907, 36523006, G11C 800

Patent

active

057128219

ABSTRACT:
A redundancy circuit of a semiconductor memory device is provided, including: a plurality of repairing word lines for repairing the normal word line connected to a failed cell; a plurality of repairing paths for selecting a random repairing word line of the repairing word lines; and at least one comparing means for enabling at least two repairing word lines in case the respective paths corresponding to the same address on the normal decoding path and the repairing path are simultaneously enabled, whereby the normal word line of the failed cell is simultaneously enabled with at least two repairing word lines.

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patent: 5289416 (1994-02-01), Iwai et al.
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patent: 5517138 (1996-05-01), Baltar et al.
patent: 5539698 (1996-07-01), Suzuki
patent: 5550776 (1996-08-01), Seo et al.
patent: 5579266 (1996-11-01), Tahara

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