Reduction of particulate contaminants in chemical-vapor-depositi

Coating apparatus – Gas or vapor deposition

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118725, 4272481, C23C 1600

Patent

active

051886723

ABSTRACT:
In an epitaxial reactor system using a vacuum pump which is connected to the reaction chamber by an exhaust line, particulate contaminants normally deposit in the exhaust line near its juncture with the reaction chamber. When the vacuum pump is isolated from the reaction chamber during a back-filling operation, these contaminants can be entrained in the currents of gas normally produced in the back-filling operation. A removable baffle having the shape of a truncated cone is placed in the exhaust line at its juncture with the reaction chamber to prevent these particles from re-entering the reaction chamber.

REFERENCES:
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patent: 4583492 (1986-04-01), Cowher et al.
patent: 4834022 (1989-05-01), Mahawili
patent: 4838201 (1989-06-01), Fraas
patent: 4992044 (1991-02-01), Philipossian
Patent Abstracts of Japan, vol. 10, No. 296, (C-377), Oct. 8, 1986, & JP-A-61 111994, (Hitachi Ltd.), May 30, 1986.
Patent Abstracts of Japan, vol. 12, No. 316, (C-524) (3163), Aug. 26, 1988.
Patent Abstract of Japan, JP-A-63 089492, (Mitsubishi Electric Corp.), Apr. 20, 1988.

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