Reduction of fusible links and associated circuitry on...

Details Reduction of fusible links and associated circuitry on... Reduction of fusible links and associated circuitry on...

2006-05-16

2006-05-16

Zarabian, Amir (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S230010, C365S230030, C365S244000, C711S200000, C711S202000, C714S017000, C714S038110, C714S757000, C714S766000

Reexamination Certificate

active

07046560

ABSTRACT:
The number of fusible links and other circuit components required to provide memory cell redundancy are reduced by sharing physical memory locations among address banks that store memory addresses. Non-trial and error algorithms and techniques determine the number of addresses and the number of identical least significant bit (LSB) values that can share the same physical memory location. By sharing physical locations for identical LSB values, circuit hardware on a memory device (including fusible links and compare circuitry) is reduced. Thus, less die area is needed to provide the same degree of redundancy.

REFERENCES:
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patent: 5574689 (1996-11-01), Morgan et al.
patent: 6026505 (2000-02-01), Hedberg et al.
patent: 6144593 (2000-11-01), Cowles et al.
patent: 6154854 (2000-11-01), Stallmo
U.S. Appl. No. 10/862,284, filed Jun. 7, 2004.

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