Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-02-08
2005-02-08
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C977S726000
Reexamination Certificate
active
06854092
ABSTRACT:
A method and apparatus of reducing variations in nanoscale circuit connections. One exemplary embodiment includes: placing a first connector between a first addressing wire and a first nanowire in a partial circuit; and applying bias to the partial circuit so that a second connector is placed between a second addressing wire and a second nanowire. This method of bias connections is repeated for each wire in the full circuit. Thus, bias is used to influence the positioning of connectors on additional wires (if any) in the full circuit.
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G.L. Snider et al., “Quantum-Dot Cellular Automata,” Int'l Microprocessors and Nanotechnology Conference, Jul. 1999, pp. 90-91.
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