Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-03
2007-04-03
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S189000, C702S057000, C341S200000
Reexamination Certificate
active
11194954
ABSTRACT:
A system that facilitates reducing uncertainty in a quantized signal. During operation, the system measures a quantized output signal from a sensor. Next, the system obtains an initial value for an uncertainty interval for the quantized output signal. The system then margins the quantized output signal high by introducing a controlled increase in the mean of the quantized output signal to produce a high-margined quantized output signal. Next, the system measures the high-margined quantized output signal from the sensor. The system then uses information obtained from the high-margined quantized output signal to reduce the uncertainty interval for the quantized output signal.
REFERENCES:
patent: 4831382 (1989-05-01), Debus, Jr. et al.
patent: 4937763 (1990-06-01), Mott
patent: 5241383 (1993-08-01), Chen et al.
patent: 5448239 (1995-09-01), Blumberg et al.
patent: 5493297 (1996-02-01), Nguyen et al.
patent: 5587711 (1996-12-01), Williams et al.
patent: 0 729 234 (1996-08-01), None
Gross Kenny C.
Urmanov Aleksey M.
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
Wachsman Hal
Wong Gilbert C.
LandOfFree
Reducing uncertainty in severely quantized telemetry signals does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Reducing uncertainty in severely quantized telemetry signals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reducing uncertainty in severely quantized telemetry signals will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3755634