4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Statistical measurement

Gilbert C. Wong

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Characterizing degradation of components during...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Computer system architecture using a proximity I/O switch

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Detecting degradation of components during...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Method and apparatus for partitioning an integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Optimal bandwidth and power utilization for ad hoc networks...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
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Profile ID: LFUS-PAI-P-3019620

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