Reducing time to measure constraint parameters of components...

Details Reducing time to measure constraint parameters of components... Reducing time to measure constraint parameters of components...

2005-06-07

2005-06-07

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

06904579

ABSTRACT:
Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.

REFERENCES:
patent: 6311148 (2001-10-01), Krishnamoorthy

Affiliated with

Also associated with

Rating

Reducing time to measure constraint parameters of components... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reducing time to measure constraint parameters of components..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reducing time to measure constraint parameters of components... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3460423