Reducing programming time of a field programmable gate array emp

Details Reducing programming time of a field programmable gate array emp Reducing programming time of a field programmable gate array emp

1995-10-10

1997-08-26

Westin, Edward P.

Electronic digital logic circuitry

Multifunctional or programmable

Having details of setting or programming of interconnections...

364489, H03K 19177, G11C 1714

Patent

active

056614128

ABSTRACT:
Critical programmed reliability of a metal-to-metal amorphous silicon antifuse is a function of programming current, operating current and total programming time. The time required to program a field programmable gate array is reduced by classifying antifuses to be programmed into three or more classes according to the amount of programming time required to achieve critical programmed reliability under programming current and operating current conditions. Each of these classes of antifuses is programmed with near the minimum programming time required to program every antifuse in the class to critical reliability. In this way, large numbers of antifuses are not programmed with significantly greater amounts of programming time than are actually required to program them to critical reliability. The time required to program the field programmable gate array is therefore reduced. Techniques for obtaining critical reliability data used in classifying antifuses are also disclosed. Classifications based on antifuse type, programming method, and operating conditions are also disclosed.

REFERENCES:
patent: 4569120 (1986-02-01), Stacy et al.
patent: 5008855 (1991-04-01), Eltoukhy et al.
patent: 5083083 (1992-01-01), El-Ayat et al.
patent: 5126282 (1992-06-01), Chiang et al.
patent: 5130777 (1992-07-01), Galbraith et al.
patent: 5194759 (1993-03-01), El-Ayat et al.
patent: 5208530 (1993-05-01), El-Ayat et al.
patent: 5223792 (1993-06-01), El-Ayat et al.
patent: 5243226 (1993-09-01), Chan
patent: 5257225 (1993-10-01), Lee
patent: 5272388 (1993-12-01), Bakker
patent: 5293133 (1994-03-01), Birkner et al.
patent: 5299150 (1994-03-01), Galbraith et al.
patent: 5302546 (1994-04-01), Gordon et al.
patent: 5309091 (1994-05-01), El-Ayat et al.
patent: 5316971 (1994-05-01), Chiang et al.
patent: 5327024 (1994-07-01), Cox
patent: 5341092 (1994-08-01), El-Ayat et al.
patent: 5349248 (1994-09-01), Parlour et al.
patent: 5365165 (1994-11-01), El-Ayat et al.
patent: 5371414 (1994-12-01), Galbraith
patent: 5414364 (1995-05-01), McCollum
patent: 5416367 (1995-05-01), Chan et al.
patent: 5424655 (1995-06-01), Chua et al.
patent: 5544070 (1996-08-01), Cox et al.
Actel Corporation, 1994 FPGA Data Book and Design Guide, "Testing and Programming Actel Field Programmable Gate Arrays (FPGAs)," pp. 4-1 through 4-8 (1993).
Actel Corporation, 1994 FPGA Data Book and Design Guide, "ACT Family Reliability Report," pp. 4-9 through 4-28 (1993).
Actel Corporation, 1994 FPGA Data Book and Design Guide, "Antifuse Field Programmable Gate Arrays," Green et al., pp. 4-29 through 4-43 (1993).
Actel Corporation, 1994 FPGA Data Book and Design Guide, "Oxide-Nitride-Oxide Antifuse Reliability," Chiang et al., pp. 4-45 through 4-51 (1993).
QuickLogic Corporation, 1994 QuickLogic Data Book, "pASIC 1 Family ViaLink Technology Very-High-Speed CMOS FPGAs," pp. 2-1 through 2-36 (1992).
QuickLogic Corporation, 1994 QuickLogic Data Book, "pASIC 1 Family Reliability Report," pp. 5-3 through 5-21 (1992).
Wong and Gordon, 1994 QuickLogic Data Book, "Conducting Filament of the Programmed Metal Electrode Amorphous Silicon Antifuse," pp. 6-3 through 6-10 (1992).
Wong and Gordon, 1994 QuickLogic Data Book, "Reliability Mechanism of the Unprogrammed Amorphous Silicon Antifuse," pp. 6-11 through 6-18 (1992).

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