Electronic digital logic circuitry – Signal sensitivity or transmission integrity
Reexamination Certificate
2005-04-05
2005-04-05
Le, Don (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
C333S012000
Reexamination Certificate
active
06876223
ABSTRACT:
EMI caused on a sensitive pin by large electric current flowing through a load pin when driving a high load is reduced or substantially eliminated. An equal amount of current, but in opposite direction, is caused to be flown in another pin (“third pin”) located close to the load pin. As a result, the EMI caused by the third pin cancels the EMI generated by the load pin. During a discharge phase, a fourth pin carries and equal amount of current, but in opposite direction, to that in the load pin. The third and fourth pins may be formed by power supply pin and ground pin. A control path may avoid a path from the third pin to the fourth pin during both the charging and discharging phases. In addition, the high load may be driven by a programmable driver which uses an amount of current proportionate to the extent of load, thereby avoiding parasitic currents. EMI is further reduced as a result.
REFERENCES:
patent: 5081374 (1992-01-01), Davis
patent: 6008705 (1999-12-01), Ghoshal
patent: 6184702 (2001-02-01), Takahashi et al.
patent: 6337798 (2002-01-01), Hailey et al.
patent: 6670830 (2003-12-01), Otsuka et al.
patent: 6703868 (2004-03-01), Savaria et al.
Kumar Anil
Rajendran Gireesh
Sahu Debapriya
Venkatraman Srinivasan
Brady III Wade James
Le Don
Neerings Ronald O.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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