Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-05-03
2011-05-03
Dang, Phuc T (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S192000, C438S530000
Reexamination Certificate
active
07936017
ABSTRACT:
A method, gated device and design structure are presented for providing reduced floating body effect (FBE) while not impacting performance enhancing stress. One method includes forming damage in a portion of a substrate adjacent to a gate; removing a portion of the damaged portion to form a trench, leaving another portion of the damaged portion at least adjacent to a channel region; and substantially filling the trench with a material to form a source/drain region.
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Clark, Jr. William F.
Furukawa Toshiharu
Hua Xuefeng
Koburger, III Charles W.
Robison Robert R.
Canale Anthony
Dang Phuc T
Hoffman Warnick LLC
International Business Machines - Corporation
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