Redistribution layer enhancement to improve reliability of...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Wire contact – lead – or bond

Reexamination Certificate

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C257S780000

Reexamination Certificate

active

08084871

ABSTRACT:
An enhanced redistribution layer is provided that geometrically expands redistribution layer (RDL) pads associated with a ball grid array of a wafer level package (WLP) to provide tensile stress relief during temperature cycle and/or drop testing of the WLP.

REFERENCES:
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patent: 2008/0248614 (2008-10-01), Yang et al.
patent: 2008/0308934 (2008-12-01), Alvarado et al.
patent: 2009/0057887 (2009-03-01), Mclellan et al.
patent: 2009/0174069 (2009-07-01), Nguyen et al.
patent: 2010/0181642 (2010-07-01), Sarfaraz et al.
patent: 2011/0049725 (2011-03-01), Topacio et al.
PCT: International Search Report and Written Opinion of the International Searching Authority for PCT/US2010/056116 (counterpart application); Jun. 27, 2011; 11 pages.

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