Recording test information to identify memory cell errors

Details Recording test information to identify memory cell errors Recording test information to identify memory cell errors

2005-11-01

2005-11-01

Chung, Phung My (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S736000, C714S724000

Reexamination Certificate

active

06961880

ABSTRACT:
A method of recording test information to identify a location of errors in Integrated Circuits (ICs) includes scanning a plurality of ICs with an input signal, each IC having a plurality of data locations and comparing an output response at each data location with an expected value for the data location. The method also includes storing an address in a buffer for each data location where the response at the data location does not equal the expected value corresponding to the data location.

REFERENCES:
patent: 5568437 (1996-10-01), Jamal
patent: 5790559 (1998-08-01), Sato
patent: 5856923 (1999-01-01), Jones et al.
patent: 6009028 (1999-12-01), Akiyama

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