Electrical computers and digital processing systems: multicomput – Multiple network interconnecting
Reexamination Certificate
2011-04-12
2011-04-12
Avellino, Joseph E (Department: 2454)
Electrical computers and digital processing systems: multicomput
Multiple network interconnecting
C370S242000, C370S244000, C370S245000, C370S248000, C370S229000, C709S235000, C709S239000
Reexamination Certificate
active
07925793
ABSTRACT:
There is disclosed a reconfigurable network test system. The reconfigurable test system may include a plurality of test modules, a plurality of network interface units, a plurality of bypass units, and a multi-port switch. Each of the network interface units may have a first end and a second end adapted to be connected to a network. Each bypass unit may be in communication with an associated test module, the first end of an associated network interface unit, a first associated switch port, and a second associated switch port. Each bypass unit may have a first mode wherein the associated test module is placed in communication with the first end of the associated network interface unit, and a second mode wherein the associated test module is placed in communication with the first associated switch port and the associated network interface unit is placed in communication with the second associated switch.
REFERENCES:
patent: 5198808 (1993-03-01), Kudo
patent: 5720032 (1998-02-01), Picazo et al.
patent: 5812646 (1998-09-01), Kikuchi
patent: 5949789 (1999-09-01), Davis et al.
patent: 6028847 (2000-02-01), Beanland
patent: 6212258 (2001-04-01), Bella et al.
patent: 6243510 (2001-06-01), Rauch
patent: 6262993 (2001-07-01), Kirmse
patent: 6282169 (2001-08-01), Kiremidjian
patent: 6532215 (2003-03-01), Muntz
patent: 6542928 (2003-04-01), Hammons
patent: 6950405 (2005-09-01), Van Gerrevink
patent: 7103322 (2006-09-01), Jones et al.
patent: 7269697 (2007-09-01), Reeve et al.
patent: 7606153 (2009-10-01), Nakaya et al.
patent: 7724668 (2010-05-01), Bitar
patent: 2004/0165590 (2004-08-01), Reiner et al.
patent: 2004/0236866 (2004-11-01), Dugatkin et al.
patent: 2005/0044137 (2005-02-01), Dubreuil
patent: 2005/0232159 (2005-10-01), Joo et al.
patent: 2006/0203715 (2006-09-01), Hunter et al.
patent: 2007/0011370 (2007-01-01), Venkata et al.
patent: 2008/0165610 (2008-07-01), Kim et al.
patent: 2008/0165678 (2008-07-01), Trinh et al.
Ginsberg Errol
Pepper Gerald R.
Regev Alon
Rittmeyer Bryan
Avellino Joseph E
Gunther John E.
Ixia
Khan Aftab Nasir
Sereboff Steven C.
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