Electronic digital logic circuitry – Reliability – Fail-safe
Reexamination Certificate
2011-03-08
2011-03-08
Chang, Daniel D (Department: 2819)
Electronic digital logic circuitry
Reliability
Fail-safe
C326S049000
Reexamination Certificate
active
07902857
ABSTRACT:
An apparatus and method provides the foundation for designing reconfigurable electronic computing systems. The invention relies on an ability to change the resistance state of a memristor device to achieve an optimal voltage at specific circuit nodes, whereby this dynamically and autonomously causes the circuit to reconfigure itself and produce a different output for the same input relative to the circuit's initial state. The circuit's state remains constant until the memristor's resistance is changed, at which point the circuit's function is “reprogrammed”.
REFERENCES:
patent: 2009/0097304 (2009-04-01), Choi et al.
Yenpo Ho et al. “Nonvolatile Memristor Memory: Device Characteristics and Design Implications”, Nov. 2-5, 2009, IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, pp. 485-490.
Chang Daniel D
Mancini Joseph A.
The United States of America as represented by the Secretary of
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