Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1989-06-22
1991-06-18
Wieder, Kenneth
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, 371 221, 371 251, 371 151, G01R 3128, G01R 3102
Patent
active
050252054
ABSTRACT:
A reconfigurable resource architecture enhances a test system's utilization by allowing product-mix dependent allocation of test system resources. The test system resources can be configured to test several device types with different pin counts simultaneously. The configuration can be changed to accommodate various product mixes based on pin count.
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Keenan W. Russ
Mydill Marc R.
O'Keefe Sheila
Okerblom Neal F.
Pile Sam R.
Barndt B. Peter
Comfort James T.
Nguyen Vinh P.
Sharp Melvin
Texas Instruments Incorporated
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