Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-03-27
2007-03-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S061000, C324S074000, C709S220000, C713S300000, C713S340000
Reexamination Certificate
active
11195014
ABSTRACT:
A system that generates a dynamic trace of power consumption in a computer system. The system periodically polls current sensors and associated voltage sensors within the computer system to generate dynamic traces of currents and associated voltages for individual components within the computer system. The system then generates a dynamic trace of total power consumption for the computer system based on the dynamic traces of the currents and the associated voltages for the constituent components.
REFERENCES:
patent: 4935642 (1990-06-01), Obelode et al.
patent: 4937763 (1990-06-01), Mott
patent: 5812112 (1998-09-01), Helfferich
patent: 6948082 (2005-09-01), Gschwind et al.
patent: 2005/0049729 (2005-03-01), Culbert et al.
Gross Kenny C.
Urmanov Aleksey M.
Vaidyanathan Kalyanaraman
Whisnant Keith A.
Zwinger Steven F.
Barlow John
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
Vo Hien
Wong Gilbert C.
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