Real-time management systems and methods for manufacturing...

Details Real-time management systems and methods for manufacturing... Real-time management systems and methods for manufacturing...

2007-08-21

2007-08-21

Bahta, Kidest (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S099000, C702S084000, C257SE21250

Reexamination Certificate

active

11228361

ABSTRACT:
A real-time management method for manufacturing management and yield rate analysis integration. A plurality of yield rates relating to wafer products are summed and averaged for a historical yield rate. Multiple representational inline QC parameters are selected. A statistical process is implemented and, if no extreme value and collinear parameter exists and if analysis results satisfy normal distribution, multiple optimum inline QC parameters are selected from the representational inline QC parameters. Weights of each optimum inline QC parameter are calculated. A predicted yield rate is calculated according to the historical yield rate, weights, and a plurality of measurement and target values relating to the wafer products.

REFERENCES:
patent: 5971586 (1999-10-01), Mori
patent: 2004/0228186 (2004-11-01), Kadota
patent: 2005/0149282 (2005-07-01), Tseng et al.
patent: 2005/0182596 (2005-08-01), Chang
patent: 574743 (2004-02-01), None

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