Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-07
2011-06-07
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C356S516000
Reexamination Certificate
active
07956630
ABSTRACT:
An error correction for effective-wavelength variations is implemented by adjusting the filter parameters of the quadrature demodulation algorithm of a high definition vertical scanning process using a phase step that accounts for phase-step changes associated with variations in the effective wavelength irradiating the sample when the surface is curved. The nominal phase step is replaced in the filter with an actual phase step size that includes a phase parameter generated for each pixel by calibration or modeling of a specific type of surface. This substitution eliminates all errors produced by surface-dependent variations in the effective wavelength of the irradiating light.
REFERENCES:
patent: 5471303 (1995-11-01), Ai et al.
patent: 5633715 (1997-05-01), Ai et al.
patent: 6987570 (2006-01-01), Schmit et al.
Durando Antonio R.
Nguyen Ha Tran T
Vazquez Arleen M
Veeco Instruments Inc.
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