Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-05-29
1995-12-26
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356357, 374 55, G01B 1128, G01B 1102
Patent
active
054792614
ABSTRACT:
A method and apparatus for calculating the area of an image, including the steps of selecting an image and determining a first radial line segment from the center of the image. The second step is locating at least one local minima along the first radial line segment, the minima being located by measuring the average brightness for a region immediately adjacent to it. The darkest region of the image is followed through a plurality of angles theta covering 360 degrees about the center by finding the local minimum on a ruler which is closest to the local minimum of a radial line segment adjacent to the segment for angle theta -1. The area is determined by summing the areas of individual wedge shaped slices defined by theta and theta -1.
REFERENCES:
patent: 3804527 (1974-04-01), Baughn et al.
patent: 4463600 (1984-08-01), Hobbs et al.
patent: 4641971 (1987-02-01), Korth
patent: 4989980 (1991-02-01), Berg
Honeywell Inc.
Lervick Craig J.
Pajak Robert A.
Pham Hoa Q.
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