Read disturb reduction circuit for spin transfer torque...

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S148000, C365S203000, C365S210100

Reexamination Certificate

active

08004880

ABSTRACT:
Systems, circuits and methods for reducing read disturbances in Spin Transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) are disclosed. A resistive element can be used during the read operation to control the read current and control read disturbances. An isolation element can be used to isolate the resistive element from the circuit during write operations.

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patent: 6999366 (2006-02-01), Perner et al.
patent: 7016220 (2006-03-01), Lee et al.
patent: 7394684 (2008-07-01), Inokuchi et al.
patent: 2005/0146926 (2005-07-01), Inaba
patent: 1560221 (2005-08-01), None
patent: 0518692 (2005-10-01), None
Wang Frank Z: “Diode-Free Magnetic Random Access Memory Using Spin-Dependent Tunneling Effect” Applied Physics Letters, AIP, American Institute of Physics, Melville, NY, vol. 77, No. 13, Sep. 25, 2000, pp. 2036-2038.
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Written Opinion-PCT/US08/056090, International Search Authority-European Patent Office-Jul. 11, 2008.
Translation of Office Action in Korean application 10-2009-7020232 corresponding to U.S. Appl. No. 11/771,065, citing KR0518692 dated Feb. 12, 2011.

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