Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
Reexamination Certificate
2004-09-30
2008-10-07
Louis-Jacques, Jacques (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Error/fault detection technique
C714S718000, C714S719000
Reexamination Certificate
active
07434151
ABSTRACT:
A read control system and method for a memory device are provided. One embodiment of a system, among others, includes dump logic coupled to a data source, said dump logic configured to receive a first group of a defined slice of data and a second group of the defined slice of data; and a true dump bus and a complement dump bus configured in a wired-OR arrangement, said dump logic configured to drive the first group of data onto the true dump bus and the second group of data onto the complement dump bus.
REFERENCES:
patent: 4652993 (1987-03-01), Scheuneman et al.
patent: 5300811 (1994-04-01), Suzuki et al.
patent: 5423009 (1995-06-01), Zhu
patent: 5515507 (1996-05-01), Byers et al.
patent: 5603041 (1997-02-01), Carpenter et al.
patent: 5633605 (1997-05-01), Zimmerman et al.
patent: 5703501 (1997-12-01), Geisler
patent: 6119249 (2000-09-01), Landry
patent: 6141271 (2000-10-01), Yoon et al.
patent: 6185703 (2001-02-01), Guddat et al.
patent: 6226764 (2001-05-01), Lee
patent: 6249893 (2001-06-01), Rajsuman et al.
patent: 6295618 (2001-09-01), Keeth
patent: 6430194 (2002-08-01), Ilyadis et al.
patent: 2005/0071531 (2005-03-01), Oshins
GB Search Report dated Nov. 10, 2005.
Carlson Richard Lawrence
Morganti Charles Regis
Hewlett--Packard Development Company, L.P.
Louis-Jacques Jacques
Rizk Sam
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