Reactive ion etching of tin oxide films using neutral reactant g

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

156646, 156655, 1566591, 156667, 20419235, 252 791, B44C 122, C03C 1500, C03C 2506, C23F 102

Patent

active

047785624

ABSTRACT:
High resolution patterns can be etched in tin oxide films in one step using reactive ion etching when the reactant gas consists substantially of nitrogen and/or argon and from small but effective amounts of hydrogen up to about 10 percent by volume hydrogen.

REFERENCES:
patent: 4207137 (1980-06-01), Tretola
patent: 4208241 (1980-06-01), Harshbarger et al.
patent: 4211601 (1980-07-01), Mogab
patent: 4226665 (1980-10-01), Mogab
patent: 4253907 (1981-03-01), Parry et al.
patent: 4256534 (1981-03-01), Levinstein
patent: 4259145 (1981-03-01), Harper et al.
patent: 4277304 (1981-07-01), Horiike et al.
patent: 4285763 (1981-08-01), Coldren
patent: 4310380 (1982-01-01), Flamm et al.
patent: 4312732 (1982-01-01), Degenkolb et al.
patent: 4361461 (1982-11-01), Chang
patent: 4373990 (1983-02-01), Porter
patent: 4384938 (1983-05-01), Desilets et al.
patent: 4414069 (1984-01-01), Cuomo
patent: 4424102 (1984-01-01), Brandeis et al.
Hayashi et al., "Sputter Etching of the Film", Japan, J. Appl. Phys., vol. 12 (1973), No. 9, p. 1457.
Balige et al., "Electrochemical Patterning of Tin Oxide Films", Journal of the Electrochemical Society, vol. 124, No. 7, pp. 1059-1060, Jul. 1977.
Dionex Gas Plasma Systems Advertising brochure.
Chemical Abstracts, Citation 98:64240j, "Mirofabrication of Tin Oxide Film".
Chemical Abstracts, Citation 98:26283t, "Etching of Transparent-Conductor Film", p. 612.
Chemical Abstracts, Citation 98:2628w, "Conductive Thin Film", p. 612.
Chemical Abstracts, Citation 98:44964n, "Nonisothermal Plasma Etching of Stannic Oxide Film."

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Reactive ion etching of tin oxide films using neutral reactant g does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reactive ion etching of tin oxide films using neutral reactant g, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reactive ion etching of tin oxide films using neutral reactant g will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1193386

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.