Reactive ion etch process for surface acoustic wave (SAW) device

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

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156643, 156656, 156665, 20419232, C23F 100

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active

051064715

ABSTRACT:
A dry etch process allows fabrication of very small SAW electrodes (less than 1 micron wide) on LiNbO.sub.3 (lithium niobate) or quartz substrates. In the process, analuminum (Al) layer is disposed on the substrate, and a photoresist layer is applied and exposed in the appropriate pattern. The wafer is then placed in an RIE where the Al is dry etched using a plasma containing chlorine and fluorine. The photoresist is then removed by an oxygen plasma. The oxygen also operates to replace the chlorine ions. By using this process, very precisely shaped electrodes can be formed.

REFERENCES:
patent: 3994793 (1976-11-01), Harvilchuck et al.
patent: 4069096 (1978-01-01), Reinbert et al.
patent: 4182646 (1980-01-01), Zajos
patent: 4203800 (1980-05-01), Kitcher et al.
patent: 4209349 (1980-06-01), Ho et al.
patent: 4214946 (1980-07-01), Forget et al.
patent: 4229233 (1980-10-01), Hansen et al.
patent: 4253987 (1981-03-01), Fiato
patent: 4264409 (1981-04-01), Forget et al.
patent: 4283249 (1981-08-01), Ephroth
patent: 4341593 (1982-07-01), Kurisaki et al.
patent: 4350563 (1982-09-01), Takada et al.
patent: 4502932 (1985-03-01), Kline et al.
John L. Vossen et al., Thin Film Processes, Academic Press, New York, 1978, pp. 497-498, 526-528.
Leon I. Maissel et al., Handbook of Thin Film Technology, McGraw-Hill Book Co., New York, 1970, pp. 7-40 to 7-42.
Michael Hill, "Causes and Prevention of Post-Etch Corrosion . . . ", Applied Materials Etch News Bulletin, vol. II, No. 3, Sep. 1986, pp. 1-2.
Shirley Wong et al., "Causes and Prevention of Post-Etch Metal Corrosion", Applied Material Etch News Bulletin, vol. V, No. 1, Feb. 1989, pp. 9-10.
G. Cameron et al., "Successfully Adressing Post-Etch Corrosion", Semiconductor International, May, 1989, pp. 142-147.

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