Rapid wafer thinning process

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156640, 156655, 156662, 156630, 156345, 252 795, H01L 21306, B44C 122

Patent

active

051279843

ABSTRACT:
A method for thinning a Gallium Arsenide (GaAs) layer on the backside of a wafer substrate is provided. The method involves spraying an etchant solution including NH.sub.4 OH and H.sub.2 O.sub.2, preferably in a 1:4 ratio, onto the GaAs layer as the wafer is rotated at approximately 2000 rpm. The etchant is sprayed through a plurality of spray nozzles. The process is capable of thinning a GaAs layer by about 500 .mu.m in approximately 14 to 18 minutes, depending on the etchant temperature and composition.

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James M. O'Connor et al., Rapid Controlled Thinning of Gallium Arsenide, J. Electrochem. Soc., Solid-State Science and Technology, Jan. 1988, pp. 190-193.
Applied Process Technology, Inc., Model 9165 Gallium Arsenic Wafer Etcher.

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