Rapid IR transmission thermometry for wafer temperature sensing

Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...

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374121, 374124, 374126, 374128, 374131, 374137, G01J 510, G01N 2500

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active

060627298

ABSTRACT:
A method and apparatus for measuring the temperature of an object, such as a substrate, during processing. The object is illuminated by a light source. Infrared light that is transmitted through the object is then collected and transmitted to a photodiode. The amount of light transmitted through the substrate varies as a function of substrate temperature. The photodiode generates a signal in response to the light transmitted to the photodiode and an analyzing device generates a real-time temperature reading based on the signal. The photodiode may include at least one silicon photodiode or a plurality of photodiodes made from germanium or indium/gallium/arsenide.

REFERENCES:
patent: 4956538 (1990-09-01), Moslehi
patent: 5183338 (1993-02-01), Wickersheim
patent: 5255286 (1993-10-01), Moslehi et al.
patent: 5270222 (1993-12-01), Moslehi
patent: 5326171 (1994-07-01), Thompson et al.
patent: 5568978 (1996-10-01), Johnson et al.
"Model DRS 1000 for In-Situ Temperature Measurement"; commercial literature from Thermionics Northwest Inc.; 2 pages, (no date).

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