Radiation hardening of logic circuitry using a cross...

Details Radiation hardening of logic circuitry using a cross... Radiation hardening of logic circuitry using a cross...

2006-11-28

2006-11-28

Cho, James H. (Department: 2819)

Electronic digital logic circuitry

Reliability

Fail-safe

C326S010000

Reexamination Certificate

active

07142004

ABSTRACT:
A system and method for hardening a logic circuit against radiation-event effects is provided. The system may include a logic circuit, first and second feed-forward devices, and first and second feedback devices. The logic circuit may be operable to output independently-obtained first and second redundant signals responsive to a desired input signal. Each of the first and second feed-forward devices may receive both of the first and second redundant signals. When the first and second redundant signals are in expected states, then the first and second feed-forward devices may responsively provide respective first and second feed-forward signals. Each of the first and second feedback devices may receive both of the first and second feed-forward signals. When the first and second feed-forward signals are in expected states, then the first and second feedback devices responsively feed respective first and second feedback signals back to the respective first and second redundant signals.

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“Overview: Single Event Upset Design Techniques for UTMC's RadHard MSI Logic Family”, http://ams.aeroflex.com/ProductFiles/AppNotes/MSI/seu1.pdf, printed Feb. 1, 2005, pp. 1-6.
International Search Report dated Jun. 28, 2005.

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