Electronic digital logic circuitry – Reliability – Fail-safe
Reexamination Certificate
2006-03-03
2008-09-09
Tan, Vibol (Department: 2819)
Electronic digital logic circuitry
Reliability
Fail-safe
C326S009000, C326S010000, C326S013000, C326S113000
Reexamination Certificate
active
07423448
ABSTRACT:
A radiation-hardened logic circuit prevents SET-induced transient pulses from propagating through the circuit, using two identical logic paths. The outputs of the two logic paths are fed into an exclusive-OR gate, which controls gating circuitry. The gating circuitry can be a controlled pass-gate circuit and a data latch, an adjustable threshold comparator, or two controlled latches. Transient pulse suppression is achieved with less circuitry and expense than is found in TMR circuits.
REFERENCES:
patent: 4785200 (1988-11-01), Huntington
patent: 4805148 (1989-02-01), Diehl-Nagle et al.
patent: 4809226 (1989-02-01), Ochoa, Jr.
patent: 4852060 (1989-07-01), Rockett, Jr.
patent: 4912675 (1990-03-01), Blake et al.
patent: 4914629 (1990-04-01), Blake et al.
patent: 4956814 (1990-09-01), Houston
patent: 5031180 (1991-07-01), McIver et al.
patent: 5046044 (1991-09-01), Houston et al.
patent: 5111429 (1992-05-01), Whitaker
patent: 5196734 (1993-03-01), Han
patent: 5307142 (1994-04-01), Corbett et al.
patent: 5311070 (1994-05-01), Dooley
patent: 5418473 (1995-05-01), Canaris
patent: 5504703 (1996-04-01), Bansal
patent: 5525923 (1996-06-01), Bialas, Jr. et al.
patent: 5870332 (1999-02-01), Lahey et al.
patent: 6327176 (2001-12-01), Li et al.
patent: 6404237 (2002-06-01), Mathew et al.
patent: 6417710 (2002-07-01), Bartholet
patent: 6573774 (2003-06-01), Gardner
patent: 6744661 (2004-06-01), Shubat
patent: 6831496 (2004-12-01), Gardner
patent: 6963217 (2005-11-01), Samudrala et al.
patent: 7071749 (2006-07-01), Gardner
patent: 2004/0257108 (2004-12-01), Carlson et al.
patent: 2007/0097728 (2007-05-01), Fukui
patent: 2007/0109012 (2007-05-01), Erstad et al.
Aeroflex Colorado Springs Inc.
Hogan & Hartson LLP
Kubida William J.
Meza Peter J.
Tan Vibol
LandOfFree
Radiation hardened logic circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Radiation hardened logic circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Radiation hardened logic circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3973248