Electronic digital logic circuitry – Reliability – Fail-safe
Reexamination Certificate
2008-09-09
2008-09-09
Tan, Vibol (Department: 2819)
Electronic digital logic circuitry
Reliability
Fail-safe
C326S009000, C326S010000, C326S013000, C326S113000
Reexamination Certificate
active
11367951
ABSTRACT:
A radiation-hardened logic circuit prevents SET-induced transient pulses from propagating through the circuit, using two identical logic paths. The outputs of the two logic paths are fed into an exclusive-OR gate, which controls gating circuitry. The gating circuitry can be a controlled pass-gate circuit and a data latch, an adjustable threshold comparator, or two controlled latches. Transient pulse suppression is achieved with less circuitry and expense than is found in TMR circuits.
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Aeroflex Colorado Springs Inc.
Hogan & Hartson LLP
Kubida William J.
Meza Peter J.
Tan Vibol
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