Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-21
2006-03-21
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07017129
ABSTRACT:
A method and apparatus for improved race detection and expression is disclosed. The race detection method and apparatus disclosed herein detects races statically by analyzing the circuits, which are usually written in a hardware description language (HDL), such as VHDL or Verilog. Compared with known simulation approaches, the inventive method and apparatus has at least the following advantages: no test vectors are required; all potential races can be detected; and in simulator approaches, if the right test vectors are not provided, then the races cannot be found (the invention avoids this last constraint).
REFERENCES:
patent: 5608645 (1997-03-01), Spyrou
patent: 5648909 (1997-07-01), Biro et al.
patent: 6430731 (2002-08-01), Lee et al.
patent: 6601221 (2003-07-01), Fairbanks
Fisher et al, “Race-Free State Assignments for Synthesizing Large-Scale Asynchronous Sequential Logic Circuits”, IEEE 1993.
Goering, “SureFire reveals new verification approach”, EE Times, Dec. 7, 1998.
Bowers Brandon
Glenn Michael A.
Glenn Patent Group
Siek Vuthe
Verisity Design, Inc.
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