Quality control method for detecting defective polishing pads us

Radiant energy – Radiation tracer methods

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2504581, G01T 1161

Patent

active

056506198

ABSTRACT:
The present invention is a quality control method that denotes non-uniformities of structural features on a planarizing surface of a polishing pad across substantially the whole surface area of the pad. In one embodiment of the method, an indicating compound applied to the planarizing surface of a polishing pad adjoins to the structural feature on the planarizing surface of the pad in proportion to the density of the structural feature. Excess indicating compound is then removed from the planarizing surface of the pad to leave the portion of the indicating compound that adjoined to the structural feature in the pad. The indicating compound is readily visible, and thus non-uniform areas on the planarizing surface with a high density of the structural feature are stained a darker shade of color than other areas on the pad. The planarizing surface is subsequently evaluated to determine whether the surface area with an excess density of indicating compound is within a desired range.

REFERENCES:
patent: 2806959 (1957-09-01), Forest et al.

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