Protraction device for a measuring microscope

Details Protraction device for a measuring microscope Protraction device for a measuring microscope

1995-10-04

1997-04-15

Henry, Jon W.

Optical: systems and elements

Compound lens system

Microscope

356140, G01B 904

Patent

active

056215657

ABSTRACT:
A protraction device for a measuring microscope comprises a reticle aligned on an optical path of the microscope at an intermediate image plane thereof and adapted for rotation about a central axis, and an angle encoder operably coupled to the reticle such that when the angle encoder is rotated about its rotational axis, a corresponding rotation is produced in the reticle. The angle encoder provides a signal representative of an angular displacement of the reticle which is delivered to a printer, digital display, or the like.

REFERENCES:
patent: 4172639 (1979-10-01), Lang et al.
patent: 4568188 (1986-02-01), Weber et al.
patent: 4695304 (1987-09-01), Leitz et al.
patent: 4760429 (1988-07-01), O'Connor
patent: 4770518 (1988-09-01), Emmel
patent: 5173601 (1992-12-01), Franz
patent: 5365667 (1994-11-01), Golding

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