Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-12-30
2011-11-22
Le, Vu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000, C365S163000
Reexamination Certificate
active
08064278
ABSTRACT:
A non-volatile memory including a plurality of memory cells configured to store data and a plurality of redundant memory cells configured to be used for functionally replacing defective memory cells. The memory further includes a protection register comprising storage elements configured to store configuration data of the memory device. The storage elements of the protection register are redundant memory cells not being used to replace defective memory cells.
REFERENCES:
patent: 6614685 (2003-09-01), Wong
patent: 2002/0001233 (2002-01-01), Hotaka
patent: 2004/0080988 (2004-04-01), Harari et al.
patent: 2008/0019195 (2008-01-01), Ooishi et al.
Fackenthal Rich E.
Mills Duane
Yu Chin-Tin Tina
Baunach Jeremiah J.
Jorgenson Lisa K.
Le Vu
Seed IP Law Group PLLC
STMicroelectronics S.r.l.
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