Protection from short circuits between P and N wells

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257357, 257369, 257355, 257546, H01L 2976, H01L 2994

Patent

active

056506570

ABSTRACT:
A method of manufacture of a MOSFET device with a predetermined light positive or negative doping comprises forming a first mask upon said substrate. Dopant of a predetermined positive or negative variety is implanted through the mask. A second mask is formed over the openings in the first mask. The first mask is removed. Dopant of the opposite positive or negative variety is implanted into the openings in the second mask. The process forms a pattern of positive and negative wells in the substrate, and forms a guard ring of an opposite doping variety from the wells being protected formed in the substrate.

REFERENCES:
patent: 3665266 (1972-05-01), Drozdowicz et al.
patent: 4277291 (1981-07-01), Cerofolini et al.
patent: 4313768 (1982-02-01), Sanders et al.
patent: 4414560 (1983-11-01), Lidow
patent: 4476621 (1984-10-01), Bopp et al.
patent: 4574467 (1986-03-01), Halfacre et al.
patent: 4912054 (1990-03-01), Tomassetti
patent: 5181091 (1993-01-01), Harrington, III et al.
patent: 5262345 (1993-11-01), Nasser et al.
patent: 5293051 (1994-03-01), Mariyama et al.
patent: 5432371 (1995-07-01), Denner et al.
VLSI Technology, McGraw Hill Book Co. NY. NY. by SMSZE, pp. 486-491.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Protection from short circuits between P and N wells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Protection from short circuits between P and N wells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Protection from short circuits between P and N wells will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1561681

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.