Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-04-19
2005-04-19
Williams, Alexander Oscar (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S355000, C257S630000, C257S356000, C257S529000, C257S528000, C257S532000, C324S750010, C455S083000, C363S126000, C333S104000, C330S310000
Reexamination Certificate
active
06882014
ABSTRACT:
A protection circuit for MOS components. In the protection circuit, a bypass PMOS transistor has a gate, a source and a substrate, all coupled to a first voltage node and a drain coupled to a gate of a MOS component. A bypass NMOS transistor has a gate, a source and a substrate, all coupled to a second voltage node and a drain coupled to the gate of the MOS component. When positive charges are accumulated on the gate of the MOS component due to an antenna effect, the bypass PMOS transistor dissipates the positive charges to the first voltage node. On the contrary, when negative charges are accumulated on the gate of the MOS component due to antenna effect, the bypass NMOS transistor dissipates the negative charges to the second voltage node.
REFERENCES:
patent: 4929887 (1990-05-01), Robitaille et al.
patent: 6537883 (2003-03-01), Chen et al.
patent: 20020153593 (2002-10-01), Chen et al.
Taiwan Semiconductor Manufacturing Co. Ltd.
Williams Alexander Oscar
LandOfFree
Protection circuit for MOS components does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Protection circuit for MOS components, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Protection circuit for MOS components will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3409843